The Cryogenic Wafer Prober – A Leap in Cryogenic Wafer Level Testing
Publish Date: February 19, 2019
We are proud to present our new cryogenic tool, which is developed to make full wafer probing at cryogenic temperatures below 4 K possible. We have combined our expertise of building “dry” cryogenic systems with a neighboring company Afore, who has long experience in building automated wafer level test systems. Together we created The Cryogenic Wafer Prober. This new tool allows up to 100 times faster throughput in sample characterization and we foresee that it will dramatically help speeding up the developments of cryogenic quantum devices, electronics and detectors.
“This was indeed a challenge, and to be able to take on a tool like this, we reached out to another Finnish company, Afore, which has long experience in specialized wafer probe systems. Together we came up with a design for a tool, the cryogenic wafer prober, which we now have constructed and assembled. We are looking forward in excitement to see the advances this tool will bring to the future of quantum computing.” says Dr. David Gunnarsson, Bluefors chief sales officer and principal scientist.
