The Cryogenic Wafer Prober
We are proud to present our new cryogenic tool, which is developed to make full wafer probing at cryogenic temperatures below 4 K possible. We have combined our expertise of building “dry” cryogenic systems with a neighboring company Afore, who has long experience in building automated wafer level test systems. Together we created The Cryogenic Wafer Prober. This new tool allows up to 100 times faster throughput in sample characterization and we foresee that it will dramatically help speeding up the developments of cryogenic quantum devices, electronics and detectors.