The Cryogenic Wafer Prober

We are proud to present our new cryogenic tool, which is developed to make full wafer probing at cryogenic temperatures below 4 K possible. We have combined our expertise of building “dry” cryogenic systems with a neighboring company Afore, who has long experience in building automated wafer level test systems. Together we created The Cryogenic Wafer Prober. This new tool allows up to 100 times faster throughput in sample characterization and we foresee that it will dramatically help speeding up the developments of cryogenic quantum devices, electronics and detectors.

Technical Specifications

  • Chuck temperatures well below 4 K is ensured with a dedicated closed-loop helium cooling system from Bluefors
  • Pre-cooling with pulse tube coolers, “cryogen-free”
  • Compatible with the full-range of Bluefors existing cryogenic wiring options
  • Up to 300 mm wafers
  • Load-lock based wafer loading, with possibility of automatic wafer loading cassette-2-cassette
  • Cryogenic probe cards with direct connection to wiring
  • Active wafer and pin-to-pad alignment.
  • Probe station control and tester integration with embedded or customer chosen software

Contact our sales team for questions and requests.

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