The Cryogenic Wafer Prober, first released in 2019, was developed by Bluefors in collaboration with Afore to make automatic wafer probing at cryogenic temperatures, well below 4 K, possible. At the time of the Cryogenic Wafer Prober release, we envisioned the tool to dramatically help speed-up the testing of cryogenic quantum devices, circuits, and detectors. In practice, the system allows more than 100 times faster throughput in sample characterization than conventional testing.
The latest to announce their acquisition of the Cryogenic Wafer Prober is CEA-Leti (the French Alternative Energies and Atomic Energy Commission’s technology research institute), who are planning to use the tool to characterize silicon-based qubits, measuring their performance at low temperatures.
“Our measurement system, the Cryogenic Wafer Prober, helps our customers to reach a higher pace in the development of the new devices and refining the technology. These unique machines will become an essential part of the R&D and ramp-up to future commercial production of quantum and superconducting devices.”, says Vitaly Emets, a Senior Sales Engineer at Bluefors.
For more information on the Cryogenic Wafer Prober, contact our Sales team.